The IMS5420-TH white light interferometer opens up new perspectives in industrial thickness measurement of monocrystalline silicon wafers. Due to its broadband superluminescent diode (SLED), the IMS5420-TH can be used for undoped, doped and highly…

The new thicknessSENSOR ILD1420LL offers even more precision, above all for thickness measurements of metal objects. The ready-to-use sensor system provides non-contact measurement of the thickness of strip and sheet materials. A special feature is…

Eddy current-based inductive sensors of the eddyNCDT series are characterized by micrometer precision and high levels of performance with maximum user convenience. The world’s largest range of sensors allows for a wide variety of applications in…

The draw-wire displacement sensors of the wireSENSOR MK88 and K100 series can now detect even larger measuring ranges. They are now also equipped with a CANopen interface. Draw-wire displacement sensors are used especially in the field of mobile…